J.A. Woollam
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J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Optical crystals, Thin films, Spectroscopy, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Thin films, Spectroscopy, Optical crystals, ... Features: Non Destructive, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Nanoscience, Thin films, Coating, ... Features: Fast Spectral Detection, Imaging, ... Techniques: , Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
J.A. Woollam VASE The VASE is an accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. Applications: , Coating, Coating, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ...