J.A. Woollam
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J.A. Woollam Alpha-SE For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds. Applications: Thin films, surface analysis, Nanoscience, ... Features: Non Destructive, Non Destructive, ... Techniques: Spectroscopic ellipsometry, ... -
J.A. Woollam M-2000 The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. Applications: Liquid crystal, Nanoscience, Optical crystals, ... Features: Wide Spectral Range, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, ... -
J.A. Woollam RC2 The RC2 design builds on 25 years of experience. Applications: Coating, Spectroscopy, Nanoscience, ... Features: Imaging, Flexible System Integration, ... Techniques: , Spectroscopic ellipsometry, Spectroscopic ellipsometry, ...