J.A. Woollam
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J.A. Woollam Alpha-SE For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds. Applications: Quality control of the product, Optical crystals, Liquid crystal, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ... -
J.A. Woollam M-2000 The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. Applications: Liquid crystal, surface analysis, Spectroscopy, ... Features: , Wide Spectral Range, ... Techniques: Spectroscopic ellipsometry, ... -
J.A. Woollam RC2 The RC2 design builds on 25 years of experience. Applications: surface analysis, Spectroscopy, Nanoscience, ... Features: Fast Spectral Detection, Wide Spectral Range, ... Techniques: , Spectroscopic ellipsometry, Spectroscopic ellipsometry, ...