J.A. Woollam
-
J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Nanoscience, Coating, Spectroscopy, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Nanoscience, Thin films, Quality control of the product, ... Features: Low temperature, Wide Spectral Range, ... Techniques: Spectroscopic ellipsometry, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Nanoscience, Liquid crystal, surface analysis, ... Features: Non Destructive, Low temperature, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ... -
J.A. Woollam VASE The VASE is an accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. Applications: , Thin films, Thin films, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ...