Flexible System Integration
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J.A. Woollam M-2000 The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. Applications: Optical crystals, surface analysis, Thin films, ... Features: Low temperature, Non Destructive, ... Techniques: Spectroscopic ellipsometry, ... -
Measurement of Hall Effect and Sample Mobility Applications: Semiconductors, Thin films, Solar Energy, ... Features: Flexible System Integration, ... Techniques: Electrical transport, Magneto resistance, ... -
J.A. Woollam RC2 The RC2 design builds on 25 years of experience. Applications: Thin films, Optical crystals, Liquid crystal, ... Features: Imaging, Non Destructive, ... Techniques: , , Spectroscopic ellipsometry, ...