Flexible System Integration
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J.A. Woollam M-2000 The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. Applications: Quality control of the product, Spectroscopy, Optical crystals, ... Features: Fast Spectral Detection, Fast Spectral Detection, ... Techniques: Spectroscopic ellipsometry, ... -
Measurement of Hall Effect and Sample Mobility Applications: Electrical Characterization, Spintronics / magneto-electronics, Electronics, ... Features: Flexible System Integration, ... Techniques: Magneto resistance, Electrical transport, ... -
J.A. Woollam RC2 The RC2 design builds on 25 years of experience. Applications: Thin films, Nanoscience, Coating, ... Features: Low temperature, Imaging, ... Techniques: , , Spectroscopic ellipsometry, ...