Imaging
-
CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: Semiconductors, Electronics, Aerospace, ... Features: No External Cooling Requirements, Automation, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Finding new material, Semiconductors, Thin films, ... Features: Vibration Stability, Imaging, ... Techniques: Atomic Force Microscopy, Nanopositioners, Scanning Electron Microscopy, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Coating, Finding new material, Semiconductors, ... Features: Imaging, Non Destructive, ... Techniques: , Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Semiconductors, Thin films, Finding new material, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Scanning Electron Microscopy, Professional Scientific and Technical Services, Nanopositioners, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Microscopy, Nano-Indentation, Quality control of the product, ... Features: Vibration Stability, Imaging, ... Techniques: Scanning Electron Microscopy, Nanopositioners, Atomic Force Microscopy, ...
-
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Spectroscopy, Quality control of the product, Liquid crystal, ... Features: Flexible System Integration, Low temperature, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: surface analysis, Semiconductors, Thin films, ... Features: Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Spintronics / magneto-electronics, Finding new material, Nanoscience, ... Features: Non Destructive, Vibration Stability, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Optical crystals, Spectroscopy, Thin films, ... Features: Non Destructive, Low temperature, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ...