Imaging
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CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: Semiconductors, Aerospace, Spectroscopy, ... Features: Non Destructive, No External Cooling Requirements, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Semiconductors, Material inspection, Nanoscience, ... Features: Ultra high sensibility, Vibration Stability, ... Techniques: Scanning Electron Microscopy, Microscopy, Professional Scientific and Technical Services, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Magnetic properties, Quantum optics, Thin films, ... Features: Vibration Stability, Magnetic fields, ... Techniques: Microscopy, Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Patterned magnetic media, Spintronics / magneto-electronics, Material inspection, ... Features: Correlative Analysis, Ultra high sensibility, ... Techniques: Scanning Electron Microscopy, Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Coating, Thin films, Electron Backscatter Diffraction, ... Features: Vibration Stability, Imaging, ... Techniques: Atomic Force Microscopy, Nanopositioners, Electron beam, ...
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J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Thin films, Liquid crystal, Nanoscience, ... Features: Non Destructive, Low temperature, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Semiconductors, Spectroscopy, Nanoscience, ... Features: Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
Qnami Quantum Magnetometry at Atomic Scale Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Nanoscience, Magnetic properties, Spintronics / magneto-electronics, ... Features: Magnetic fields, Correlative Analysis, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Nanoscience, Quality control of the product, Liquid crystal, ... Features: Non Destructive, Non Destructive, ... Techniques: , , Spectroscopic ellipsometry, ...