Imaging
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CS Instruments AFM Galaxy Dual Controller The GALAXY DUAL controller creates new opportunities for AFM users by combining new features with those already available on your existing AFM. This new controller offers more than a second life to your AFM, it renews and improves the performance with new imaging modes and new intuitive software. Applications: Semiconductors, Electronics, Thin films, ... Features: No External Cooling Requirements, Non Destructive, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
Quantum Design FusionScope FusionScope is an easy-to-use correlative microscopy platform designed from the ground up to add the benefits of SEM imaging to a wide range of AFM measurement techniques. Applications: Semiconductors, Coating, Electrical Characterization, ... Features: Ultra high sensibility, Vibration Stability, ... Techniques: Electron beam, Microscopy, Professional Scientific and Technical Services, ... -
GETec GETec AFSEM Insert AFM insert allows correlative AFM and SEM characterization Applications: Fracture Mechanics, Electronics, Electron Backscatter Diffraction, ... Features: Compact / Portable, Vibration Stability, ... Techniques: Atomic Force Microscopy, Energy-dispersive X-ray spectroscopy (EDS), Scanning Electron Microscopy, ... -
Enlitech Image Sensor / Fingerprint-on-Display Testing The SG-A system is the world’s first commercial CMOS Image sensor tester. SG-A can provide the most comprehensive CMOS image sensor parameter characterizations. Applications: Electronics, Finding new material, Photon experiments, ... Features: Non Destructive, Compact / Portable, ... Techniques: Sensor Tester, ... -
J.A. Woollam M-2000 The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. Applications: Nanoscience, Spectroscopy, Quality control of the product, ... Features: Fast Spectral Detection, Wide Spectral Range, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM The Nano-Observer AFM microscope is a flexible and powerful AFM. Designed with the ultimate technologies, it combines performance and ease of use. Applications: Microscopy, surface analysis, Spectroscopy, ... Features: Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
icspi nGauge AFM Collect nanoscale topography data on your benchtop in three clicks with the nGauge AFM Applications: Fracture Mechanics, Thin films, Quality control of the product, ... Features: No External Cooling Requirements, Compact / Portable, ... Techniques: Atomic Force Microscopy, ... -
Enlitech PERC/ HJT/ TOP-Con PV Cell Efficiency-Loss, Current-Loss, Voltage-Loss, and Fill-Factor-Loss Analysis Solution QE-R quantum efficiency system is a PV cell tester which can provide cell’s EQE. IPCE, IQE and spectral response data accurately and rapidly. Applications: Electronics, Finding new material, Electrical Characterization, ... Features: Compact / Portable, Customizable chamber, ... Techniques: Sensor Tester, ... -
J.A. Woollam RC2 The RC2 design builds on 25 years of experience. Applications: Spectroscopy, surface analysis, Optical crystals, ... Features: Imaging, Low temperature, ... Techniques: , , Spectroscopic ellipsometry, ... -
Enlitech SS-PST100R AM1.5G Spectrum Adjustable Solar Simulator With the rapid development of high-efficiency tandem solar cells, especially perovskite/crystalline silicon tandem solar cells, the need for accurate measurement of the conversion efficiency of tandem cells has attracted a lot of attention. Applications: Coating, Intermetallics, Electrical Characterization, ... Features: Compact / Portable, Customizable chamber, ... Techniques: Solar Simulator, ...