Imaging
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CS Instruments AFM Galaxy Dual Controller The GALAXY DUAL controller creates new opportunities for AFM users by combining new features with those already available on your existing AFM. This new controller offers more than a second life to your AFM, it renews and improves the performance with new imaging modes and new intuitive software. Applications: Electronics, surface analysis, Semiconductors, ... Features: Automation, Non Destructive, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
GETec GETec AFSEM Insert AFM insert allows correlative AFM and SEM characterization Applications: Chemical mapping, Nanoscience, surface analysis, ... Features: Correlative Analysis, Non Destructive, ... Techniques: Scanning Electron Microscopy, Microscopy, Atomic Force Microscopy, ... -
J.A. Woollam M-2000 The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. Applications: Optical crystals, Thin films, surface analysis, ... Features: , Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM The Nano-Observer AFM microscope is a flexible and powerful AFM. Designed with the ultimate technologies, it combines performance and ease of use. Applications: Semiconductors, surface analysis, Spectroscopy, ... Features: Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
icspi nGauge AFM Collect nanoscale topography data on your benchtop in three clicks with the nGauge AFM Applications: Quality control of the product, Semiconductors, Thin films, ... Features: Automation, Non Destructive, ... Techniques: Atomic Force Microscopy, ... -
J.A. Woollam RC2 The RC2 design builds on 25 years of experience. Applications: surface analysis, Thin films, Liquid crystal, ... Features: , Flexible System Integration, ... Techniques: , Spectroscopic ellipsometry, Spectroscopic ellipsometry, ...