Imaging
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CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: Thin films, Electronics, Spectroscopy, ... Features: Non Destructive, Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
Coxem CX-200K High Quality Full-Size SEM Applications: Healthcare, Nanoscience, Catalysis, ... Features: Vibration Stability, Ultra high sensibility, ... Techniques: Scanning Electron Microscopy, Microscopy, ... -
Coxem CX-200Plus Full Size Scanning Electron Microscope Applications: Healthcare, Catalysis, Intermetallics, ... Features: SEM Charge-up prevention, Imaging, ... Techniques: Microscopy, Scanning Electron Microscopy, ... -
Coxem EM-30N Tungsten Filament Tabletop SEM Applications: Electronics, Patterned magnetic media, Electron Backscatter Diffraction, ... Features: Correlative Analysis, Ultra high sensibility, ... Techniques: Microscopy, Scanning Electron Microscopy, ... -
Coxem EM-40 Advanced Tabletop SEM Applications: Electronics, Aerospace, Microscopy, ... Features: Imaging, Correlative Analysis, ... Techniques: Microscopy, Scanning Electron Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Patterned magnetic media, Nano-Indentation, Coating, ... Features: Vibration Stability, Correlative Analysis, ... Techniques: Microscopy, Nanopositioners, Electron beam, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Semiconductors, Nano-Indentation, Microscopy, ... Features: SEM Charge-up prevention, Vibration Stability, ... Techniques: Scanning Electron Microscopy, Professional Scientific and Technical Services, Microscopy, ...
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Enlitech Image Sensor / Fingerprint-on-Display Testing World's First Commercial CMOS Image Sensor Tester Applications: Electrical Characterization, Finding new material, Coating, ... Features: Non Destructive, Imaging, ... Techniques: Sensor Tester, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Spectroscopy, Coating, Quality control of the product, ... Features: Fast Spectral Detection, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Coating, Microscopy, surface analysis, ... Features: Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
ICSPI nGauge AFM Nanoscale Topography at Your Desk Applications: Nano-Indentation, Thin films, Intermetallics, ... Features: Automation, Non Destructive, ... Techniques: Atomic Force Microscopy, ... -
Enlitech PERC/ HJT/ TOP-Con PV Cell Efficiency-Loss, Current-Loss, Voltage-Loss, and Fill-Factor-Loss Analysis Solution PV Cell Tester Applications: Electronics, Intermetallics, Coating, ... Features: Customizable chamber, Non Destructive, ... Techniques: Sensor Tester, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Magnetic properties, Thin films, Patterned magnetic media, ... Features: Vibration Stability, Correlative Analysis, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
Quantum Catalyzer Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Semiconductors, Thin films, Finding new material, ... Features: Magnetic fields, Imaging, ... Techniques: Microscopy, Microscopy, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Optical crystals, Spectroscopy, Coating, ... Features: Flexible System Integration, Flexible System Integration, ... Techniques: , , Spectroscopic ellipsometry, ... -
Enlitech SS-PST100R AM1.5G Spectrum Adjustable Solar Simulator High Standard Solar Simulator Applications: Electrical Characterization, Material inspection, Finding new material, ... Features: Imaging, Non Destructive, ... Techniques: Solar Simulator, ...