Imaging
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CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: Semiconductors, Aerospace, Electronics, ... Features: Imaging, Non Destructive, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Intermetallics, surface analysis, Coating, ... Features: Vibration Stability, Ultra high sensibility, ... Techniques: Professional Scientific and Technical Services, Electron beam, Scanning Electron Microscopy, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Microscopy, Semiconductors, Material inspection, ... Features: Vibration Stability, Imaging, ... Techniques: Microscopy, Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Magnetic properties, Nanoscience, Microscopy, ... Features: Vibration Stability, Ultra high sensibility, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, Microscopy, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Thin films, Finding new material, Electrical Characterization, ... Features: Correlative Analysis, Imaging, ... Techniques: Professional Scientific and Technical Services, Nanopositioners, Atomic Force Microscopy, ...
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J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Optical crystals, surface analysis, Quality control of the product, ... Features: Fast Spectral Detection, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: Microscopy, Coating, Nanoscience, ... Features: Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Finding new material, surface analysis, Magnetoresistance, ... Features: Correlative Analysis, Non Destructive, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Optical crystals, Coating, Liquid crystal, ... Features: Imaging, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ...