Imaging
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CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: Electronics, Semiconductors, surface analysis, ... Features: No External Cooling Requirements, Automation, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: surface analysis, Material inspection, Electronics, ... Features: Imaging, SEM Charge-up prevention, ... Techniques: Scanning Electron Microscopy, Nanopositioners, Atomic Force Microscopy, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Material inspection, Finding new material, Finding new material, ... Features: Magnetic fields, Non Destructive, ... Techniques: Microscopy, Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Quality control of the product, Finding new material, Semiconductors, ... Features: Vibration Stability, Correlative Analysis, ... Techniques: Nanopositioners, Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Material inspection, Thin films, Electron Backscatter Diffraction, ... Features: Ultra high sensibility, Correlative Analysis, ... Techniques: Nanopositioners, Professional Scientific and Technical Services, Electron beam, ...
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J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Quality control of the product, surface analysis, Liquid crystal, ... Features: Non Destructive, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, ... -
CS Instruments Nano-Observer AFM High-End AFM With High Performance and Ease of Use Applications: surface analysis, Semiconductors, Aerospace, ... Features: Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Spintronics / magneto-electronics, Coating, Intermetallics, ... Features: Magnetic fields, Correlative Analysis, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Spectroscopy, Quality control of the product, Thin films, ... Features: , Non Destructive, ... Techniques: , , Spectroscopic ellipsometry, ...