Non Destructive
-
CS Instruments AFM Galaxy Dual Controller The GALAXY DUAL controller creates new opportunities for AFM users by combining new features with those already available on your existing AFM. This new controller offers more than a second life to your AFM, it renews and improves the performance with new imaging modes and new intuitive software. Applications: Aerospace, Thin films, surface analysis, ... Features: No External Cooling Requirements, Imaging, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
J.A. Woollam Alpha-SE For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds. Applications: Nanoscience, Quality control of the product, Thin films, ... Features: Non Destructive, Non Destructive, ... Techniques: Spectroscopic ellipsometry, ... -
FlowVIEW Aquarius Even though SEM with higher magnification is used, wet materials need to be dried before inspection since their structure (e.g., cell membranes or cell walls) will be damaged in a vacuum environment. The technical barrier that the sample cannot be observed in its original state still exists. Applications: Microscopy, Healthcare, Quality control of the product, ... Features: Flexible System Integration, Compact / Portable, ... Techniques: Microscopy, Scanning Electron Microscopy, ... -
Enlitech Image Sensor / Fingerprint-on-Display Testing The SG-A system is the world’s first commercial CMOS Image sensor tester. SG-A can provide the most comprehensive CMOS image sensor parameter characterizations. Applications: Intermetallics, Electronics, Photon experiments, ... Features: Compact / Portable, Imaging, ... Techniques: Sensor Tester, ... -
J.A. Woollam M-2000 The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. Applications: Spectroscopy, Optical crystals, Nanoscience, ... Features: Low temperature, Wide Spectral Range, ... Techniques: Spectroscopic ellipsometry, ... -
ICSPI nGauge AFM Collect nanoscale topography data on your benchtop in three clicks with the nGauge AFM Applications: Thin films, surface analysis, Intermetallics, ... Features: Automation, Non Destructive, ... Techniques: Atomic Force Microscopy, ... -
Quantum Design OptiCool - 7 Tesla Optical Cryostat Applications: Thin films, Microscopy, Spintronics / magneto-electronics, ... Features: Remote Access, Non Destructive, ... Techniques: Microscopy, Magnetometry, Magneto resistance, ... -
Enlitech PERC/ HJT/ TOP-Con PV Cell Efficiency-Loss, Current-Loss, Voltage-Loss, and Fill-Factor-Loss Analysis Solution QE-R quantum efficiency system is a PV cell tester which can provide cell’s EQE. IPCE, IQE and spectral response data accurately and rapidly. Applications: Material inspection, Electronics, Electrical Characterization, ... Features: Compact / Portable, Customizable chamber, ... Techniques: Sensor Tester, ... -
Qnami ProteusQ™ Quantum Microscope Qnami ProteusQ is a complete quantum microscope system. It is the first scanning NV (nitrogen-vacancy) microscope for analyzing magnetic materials at the atomic scale. Applications: Nanoscience, Finding new material, Intermetallics, ... Features: Correlative Analysis, Vibration Stability, ... Techniques: Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
Quantum Catalyzer Quantum Diamond Microscope State of the art, wide-field imaging of magnetic fields, with applications spanning geoscience, bioimaging, electronics, materials characterization, and quantum research. Applications: Semiconductors, Thin films, Thin films, ... Features: Imaging, Magnetic fields, ... Techniques: , Microscopy, ... -
J.A. Woollam RC2 The RC2 design builds on 25 years of experience. Applications: Nanoscience, Coating, Optical crystals, ... Features: Flexible System Integration, Fast Spectral Detection, ... Techniques: , , Spectroscopic ellipsometry, ... -
Enlitech SS-PST100R AM1.5G Spectrum Adjustable Solar Simulator With the rapid development of high-efficiency tandem solar cells, especially perovskite/crystalline silicon tandem solar cells, the need for accurate measurement of the conversion efficiency of tandem cells has attracted a lot of attention. Applications: Intermetallics, Finding new material, Electrical Characterization, ... Features: Compact / Portable, Imaging, ... Techniques: Solar Simulator, ...