Non Destructive
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CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: Semiconductors, Electronics, Aerospace, ... Features: No External Cooling Requirements, Imaging, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Thin films, Quality control of the product, Optical crystals, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Closed-Cycle Optical Cryostat Low Temperature, High Magnetic Field Optica Cryostat Applications: Magnetic properties, Photon experiments, Spectroscopy, ... Features: Temperature Control, Thermal Stability, ... Techniques: Magnetometry, Microscopy, Magneto resistance, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Semiconductors, Semiconductors, Nanoscience, ... Features: Non Destructive, Vibration Stability, ... Techniques: , Microscopy, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Nanoscience, Liquid crystal, surface analysis, ... Features: , Low temperature, ... Techniques: Spectroscopic ellipsometry, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Spintronics / magneto-electronics, Coating, Thin films, ... Features: Ultra high sensibility, Correlative Analysis, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Quality control of the product, Optical crystals, Coating, ... Features: Wide Spectral Range, Fast Spectral Detection, ... Techniques: , , Spectroscopic ellipsometry, ...