Non Destructive
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J.A. Woollam Alpha-SE For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds. Applications: Coating, Optical crystals, Quality control of the product, ... Features: Remote Access, Remote Access, ... Techniques: Spectroscopic ellipsometry, ... -
FlowVIEW Aquarius Even though SEM with higher magnification is used, wet materials need to be dried before inspection since their structure (e.g., cell membranes or cell walls) will be damaged in a vacuum environment. The technical barrier that the sample cannot be observed in its original state still exists. Applications: Healthcare, Material inspection, Quality control of the product, ... Features: Flexible System Integration, Compact / Portable, ... Techniques: Scanning Electron Microscopy, Microscopy, ... -
GETec GETec AFSEM Insert AFM insert allows correlative AFM and SEM characterization Applications: Intermetallics, Chemical mapping, Magnetic properties, ... Features: Vibration Stability, Imaging, ... Techniques: Energy-dispersive X-ray spectroscopy (EDS), Scanning Electron Microscopy, Microscopy, ... -
J.A. Woollam M-2000 The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. Applications: Spectroscopy, Thin films, Quality control of the product, ... Features: Imaging, Wide Spectral Range, ... Techniques: Spectroscopic ellipsometry, ... -
icspi nGauge AFM Collect nanoscale topography data on your benchtop in three clicks with the nGauge AFM Applications: Quality control of the product, Fracture Mechanics, Nano-Indentation, ... Features: Automation, Imaging, ... Techniques: Atomic Force Microscopy, ... -
Quantum Design OptiCool - 7 Tesla Optical Cryostat Applications: Semiconductors, Spintronics / magneto-electronics, Magnetic properties, ... Features: Vibration Stability, Temperature Control, ... Techniques: Magnetometry, Optical spectroscopy, Magneto resistance, ... -
J.A. Woollam RC2 The RC2 design builds on 25 years of experience. Applications: surface analysis, Nanoscience, Spectroscopy, ... Features: Fast Spectral Detection, Non Destructive, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ...