Non Destructive
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J.A. Woollam Alpha-SE For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds. Applications: Nanoscience, Spectroscopy, surface analysis, ... Features: Remote Access, Remote Access, ... Techniques: Spectroscopic ellipsometry, ... -
GETec GETec AFSEM Insert AFM insert allows correlative AFM and SEM characterization Applications: Chemical mapping, Nanoscience, Aerospace, ... Features: Correlative Analysis, High Z Resolution, ... Techniques: Energy-dispersive X-ray spectroscopy (EDS), Microscopy, Scanning Electron Microscopy, ... -
J.A. Woollam M-2000 The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. Applications: Coating, Optical crystals, surface analysis, ... Features: Low temperature, Fast Spectral Detection, ... Techniques: Spectroscopic ellipsometry, ... -
icspi nGauge AFM Collect nanoscale topography data on your benchtop in three clicks with the nGauge AFM Applications: Coating, Fracture Mechanics, Quality control of the product, ... Features: Imaging, Compact / Portable, ... Techniques: Atomic Force Microscopy, ... -
Quantum Design OptiCool - 7 Tesla Optical Cryostat Applications: Semiconductors, Magnetic properties, Spectroscopy, ... Features: Vibration Stability, Remote Access, ... Techniques: Microscopy, Magneto resistance, Magnetometry, ... -
J.A. Woollam RC2 The RC2 design builds on 25 years of experience. Applications: Thin films, Quality control of the product, Liquid crystal, ... Features: Non Destructive, Wide Spectral Range, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ...