Non Destructive
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CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: surface analysis, Aerospace, Semiconductors, ... Features: No External Cooling Requirements, Non Destructive, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Spectroscopy, Thin films, Quality control of the product, ... Features: , Non Destructive, ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Closed-Cycle Optical Cryostat Low Temperature, High Magnetic Field Optica Cryostat Applications: Semiconductors, Spintronics / magneto-electronics, Photon experiments, ... Features: Magnetic fields, Thermal Stability, ... Techniques: Magnetometry, Magneto resistance, Optical spectroscopy, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: , Microscopy, Nanoscience, ... Features: Imaging, Non Destructive, ... Techniques: , Microscopy, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: surface analysis, Nanoscience, Coating, ... Features: Low temperature, Imaging, ... Techniques: Spectroscopic ellipsometry, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Finding new material, Nanoscience, Thin films, ... Features: Vibration Stability, Magnetic fields, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Thin films, Coating, surface analysis, ... Features: Flexible System Integration, Fast Spectral Detection, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ...