Non Destructive
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CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: Thin films, surface analysis, Spectroscopy, ... Features: Automation, No External Cooling Requirements, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Coating, Thin films, Quality control of the product, ... Features: , Remote Access, ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Closed-Cycle Optical Cryostat Low Temperature, High Magnetic Field Optica Cryostat Applications: Magnetic properties, Spectroscopy, Photon experiments, ... Features: Thermal Stability, Temperature Control, ... Techniques: Optical spectroscopy, Magneto resistance, Magnetometry, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: surface analysis, Material inspection, Magnetic properties, ... Features: Imaging, Vibration Stability, ... Techniques: , Microscopy, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Nanoscience, surface analysis, Quality control of the product, ... Features: Fast Spectral Detection, Fast Spectral Detection, ... Techniques: Spectroscopic ellipsometry, ... -
Qnami Quantum Magnetometry at Atomic Scale Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Finding new material, Patterned magnetic media, Nanoscience, ... Features: Magnetic fields, Imaging, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Coating, Optical crystals, Spectroscopy, ... Features: Low temperature, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ...