Non Destructive
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J.A. Woollam Alpha-SE For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds. Applications: Quality control of the product, surface analysis, Coating, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ... -
GETec GETec AFSEM Insert AFM insert allows correlative AFM and SEM characterization Applications: Intermetallics, Chemical mapping, Electronics, ... Features: Automation, Vibration Stability, ... Techniques: Energy-dispersive X-ray spectroscopy (EDS), Scanning Electron Microscopy, Microscopy, ... -
J.A. Woollam M-2000 The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. Applications: Optical crystals, Nanoscience, surface analysis, ... Features: Wide Spectral Range, Wide Spectral Range, ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design OptiCool - 7 Tesla Optical Cryostat Applications: Semiconductors, Spintronics / magneto-electronics, Spectroscopy, ... Features: Vibration Stability, Low temperature, ... Techniques: Microscopy, Optical spectroscopy, Magnetometry, ... -
J.A. Woollam RC2 The RC2 design builds on 25 years of experience. Applications: Coating, Nanoscience, Optical crystals, ... Features: , Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, Spectroscopic ellipsometry, Spectroscopic ellipsometry, ...