Non Destructive
-
CS Instruments AFM Galaxy Dual Controller The GALAXY DUAL controller creates new opportunities for AFM users by combining new features with those already available on your existing AFM. This new controller offers more than a second life to your AFM, it renews and improves the performance with new imaging modes and new intuitive software. Applications: Semiconductors, Electronics, surface analysis, ... Features: No External Cooling Requirements, Automation, ... Techniques: Atomic Force Microscopy, Microscopy, ... -
J.A. Woollam Alpha-SE For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds. Applications: Spectroscopy, Nanoscience, Thin films, ... Features: , Remote Access, ... Techniques: Spectroscopic ellipsometry, ... -
FlowVIEW Aquarius Even though SEM with higher magnification is used, wet materials need to be dried before inspection since their structure (e.g., cell membranes or cell walls) will be damaged in a vacuum environment. The technical barrier that the sample cannot be observed in its original state still exists. Applications: Quality control of the product, Healthcare, Microscopy, ... Features: Flexible System Integration, Compact / Portable, ... Techniques: Microscopy, Scanning Electron Microscopy, ... -
GETec GETec AFSEM Insert AFM insert allows correlative AFM and SEM characterization Applications: Thin films, Nanoscience, Magnetic properties, ... Features: Compact / Portable, HV, ... Techniques: Energy-dispersive X-ray spectroscopy (EDS), Microscopy, Scanning Electron Microscopy, ... -
J.A. Woollam M-2000 The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. Applications: Thin films, Spectroscopy, Liquid crystal, ... Features: Non Destructive, Flexible System Integration, ... Techniques: Spectroscopic ellipsometry, ... -
icspi nGauge AFM Collect nanoscale topography data on your benchtop in three clicks with the nGauge AFM Applications: Thin films, Semiconductors, Coating, ... Features: No External Cooling Requirements, Imaging, ... Techniques: Atomic Force Microscopy, ... -
Quantum Design OptiCool - 7 Tesla Optical Cryostat Applications: Microscopy, Spintronics / magneto-electronics, Thin films, ... Features: Low temperature, Thermal Stability, ... Techniques: Magnetometry, Optical spectroscopy, Magneto resistance, ... -
J.A. Woollam RC2 The RC2 design builds on 25 years of experience. Applications: Thin films, Spectroscopy, Optical crystals, ... Features: Non Destructive, Wide Spectral Range, ... Techniques: , , Spectroscopic ellipsometry, ...