Non Destructive
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CS Instruments AFM Galaxy Dual Controller Controller For Your Obsolete and New AFM Applications: Thin films, Aerospace, Semiconductors, ... Features: Imaging, Non Destructive, ... Techniques: Microscopy, Atomic Force Microscopy, ... -
J.A. Woollam Alpha 2.0 Benchtop Ellipsometer for Routine Measurements Applications: Thin films, Coating, Nanoscience, ... Features: , , ... Techniques: Spectroscopic ellipsometry, ... -
Quantum Design Closed-Cycle Optical Cryostat Low Temperature, High Magnetic Field Optica Cryostat Applications: Photon experiments, Semiconductors, Spectroscopy, ... Features: Temperature Control, Automation, ... Techniques: Optical spectroscopy, Microscopy, Magneto resistance, ... -
EuQlid EuQlid Quantum Diamond Microscope Wide-Field Imaging of Magnetic Fields in a State of the Art Device Applications: Material inspection, Material inspection, Quantum optics, ... Features: Vibration Stability, Magnetic fields, ... Techniques: , Microscopy, ... -
J.A. Woollam M-2000 Versatile Ellipsometer With CCD Detector Applications: Coating, Thin films, surface analysis, ... Features: Imaging, Wide Spectral Range, ... Techniques: Spectroscopic ellipsometry, ... -
Qnami ProteusQ™ Quantum Microscope Scanning Nitrogen Vacancy Microscope at Atomic Scale Applications: Coating, Thin films, Magnetic properties, ... Features: Ultra high sensibility, Imaging, ... Techniques: Professional Scientific and Technical Services, Atomic Force Microscopy, ... -
J.A. Woollam RC2 Highest Performance Ellipsometer Applications: Nanoscience, Quality control of the product, Coating, ... Features: Flexible System Integration, Fast Spectral Detection, ... Techniques: , Spectroscopic ellipsometry, Spectroscopic ellipsometry, ...