Electron beam
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Patterned magnetic media, Material inspection, Electron Backscatter Diffraction, ... Features: Ultra high sensibility, SEM Charge-up prevention, ... Techniques: Electron beam, Atomic Force Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Magnetic properties, Patterned magnetic media, Spintronics / magneto-electronics, ... Features: SEM Charge-up prevention, Ultra high sensibility, ... Techniques: Atomic Force Microscopy, Microscopy, Professional Scientific and Technical Services, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Intermetallics, Finding new material, Electrical Characterization, ... Features: Vibration Stability, Correlative Analysis, ... Techniques: Scanning Electron Microscopy, Microscopy, Electron beam, ...