Electron beam
-
Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Coating, Patterned magnetic media, Material inspection, ... Features: Vibration Stability, Imaging, ... Techniques: Nanopositioners, Scanning Electron Microscopy, Atomic Force Microscopy, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Semiconductors, Finding new material, Magnetic properties, ... Features: Ultra high sensibility, Imaging, ... Techniques: Nanopositioners, Atomic Force Microscopy, Electron beam, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Spintronics / magneto-electronics, Coating, Thin films, ... Features: Vibration Stability, Correlative Analysis, ... Techniques: Microscopy, Electron beam, Nanopositioners, ...