Electron beam
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Quantum Design Microscopy Atomic Force Microscope for SEM/FIB The AFSEM nano design is based on a x-y-z tip scanner, allowing it to work in tandem with nanomanipulators for simultaneous AFM and nano-probing workflows. This unique capability is particularly important in SEM-Focused Ion Beam (FIB) applications in the semiconductors industry such as delayering, nanoprobing, ... Applications: Electron Backscatter Diffraction, Finding new material, Semiconductors, ... Features: Vibration Stability, Ultra high sensibility, ... Techniques: Electron beam, Microscopy, Nanopositioners, ... -
Quantum Design FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Electronics, Spintronics / magneto-electronics, Electron Backscatter Diffraction, ... Features: SEM Charge-up prevention, Correlative Analysis, ... Techniques: Microscopy, Scanning Electron Microscopy, Electron beam, ... -
Quantum Design Microscopy FusionScope Integration Between AFM and SEM in a Seamless Platform Applications: Spintronics / magneto-electronics, Thin films, Magnetic properties, ... Features: Ultra high sensibility, Vibration Stability, ... Techniques: Professional Scientific and Technical Services, Nanopositioners, Scanning Electron Microscopy, ...